Title: Scanning Electron Microscopy

Magnified 500,000 times and yet sharp as a pin.

The use of scanning electron microscopy has become an integral part of today’s testing technologies, also in regards to failure analyses. SEM offers TPW ROWO the possibility to magnify surface structures with a range from 5 up to 500,000 times – with an extremely high depth of sharpness. Furthermore, chemical element concentrations and characteristics can be determined. The sample materials are required to be firm, dry and electroconductive. If necessary, we can coat the materials with a thin layer of carbon or gold – to ensure they don’t fail our strict scanning procedures.

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